Digital Integrated Circuit Testing From a Quality Perspective
By: Hnatek, Eugene R
.
Material type: 
TextPublisher: Van Nostrand Reinhold 1993Description: 179p.ISBN: 9780442006433.
| Item type | Home library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Books
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Faculty of Engineering (FOE) Library | Available | CEB038177 |
Open Library:
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